Ключевые слова: HTS, YBCO, MOD process, fluorine-free process, films epitaxial, resistive transition, microstructure, fabrication, quality control
Sohma M., Yamaguchi I., Kondo W., Tsukada K., Kumagai T., Nakagawa Y., Manabe T., Kamiya K., Hikata T., Matsui H.
Ключевые слова: HTS, YBCO, fabrication, films thick, fluorine-free process, MOD process, substrate SrTiO3, buffer layers, solution techniques, microstructure
Ключевые слова: HTS, REBCO, YBCO, films, substrate LaAlO3, chemical solution deposition, fluorine-free process, doping effect, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: HTS, YBCO, MOD process, fluorine-free process, irradiation effects, fabrication, microstructure, films epitaxial, substrate SrTiO3, buffer layers
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, buffer layers, coatings, chemical solution deposition, MOD process, fluorine-free process, fabrication, microstructure
Ключевые слова: patents, films, fabrication, HTS, REBCO, buffer layers, PLD process, MOD process, critical caracteristics, critical current, thickness dependence, fluorine-free process
Ключевые слова: HTS, YBCO, films epitaxial, substrate LaAlO3, MOD process, fluorine-free process, fabrication, microstructure, critical caracteristics, Jc/B curves
Ключевые слова: HTS, YBCO, films, fluorine-free process, MOD process, substrate sapphire, substrate single crystal, defects, stacking fault, pinning, co-evaporation process, critical caracteristics, Jc/B curves, angular dependence, critical current density, microstructure, fabrication, experimental results
Ключевые слова: HTS, YBCO, films, sol gel process, annealing process, fluorine-free process, fabrication, substrate LaAlO3
Ключевые слова: presentation, HTS, coated conductors, pinning centers, fabrication, MOD process, fluorine-free process, films thick, substrate SrTiO3, RABITS process, YBCO, critical caracteristics, Jc/B curves, resistance, critical temperature, pinning force, critical current density, angular dependence, thickness dependence, grain boundaries, microstructure, comparison, PLD process, MOCVD process, IBAD process, TFA-MOD process, irreversibility fields, experimental results
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